The 5200 series is the fastest analog test system available, combining high speed and the ability to accurately test a wide range of component types, effectively blurring the line between MDA, or analog In-Circuit, and full digital In-Circuit. This capability minimizes the investment in test systems by reducing the number of platforms required to achieve throughput and providing the highest level of test coverage within a single manufacturing stage.

– Up to 1200 components/sec test speed
– Maximum of 2112 pins
– Power-up testing with programmable supply option
– Automatic program generation software
– Graphical program debug capability
– Autodebug facility
– Optional functional test capability
– Inductive and capacitive vectorless test
– 19 in rack mountable

The system is controlled by an industry standard PC, with a Windows 2000™ operating system. The 5200 series has a small footprint allowing simple integration into automated in-line manufacturing facilities.
Within the range, there are two systems, the 5210 with fixed unit under test (UUT) power supplies and the 5220 offering programmable versions.

Architecture
The testframe of the 5200 series is 19 in rack mountable containing eleven slots for testpoint cards, and a further three to take a range of functional resources. Each testpoint card offers 192 pins, interfaced to the test fixture through interconnection cabling. This approach provides the user with the ability to integrate the system into an inline handler or use a range of fixturing with a human operator.

Advanced Test Techniques
Test techniques such as analog In-Circuit, boundary scan and functional ensure the highest level of fault coverage. Although by definition, a Manufacturing Defects Analyzer does not provide digital device testing through testpoint memory, the 5200 series features a digital capability through the use of boundary scan and vectorless tools.

Vectorless Test Capability
Aeroflex Limited is unique in offering both inductive and capacitive vectorless techniques, ensuring wide test coverage across a range of components from complex ASICs to connectors. Inductive probing is performed using the Aeroflex patented Q-Test II technique, whilst capacitive tests use the industry standard HP TestJet™ probe. These two techniques contribute to the system’s ability to generate tests for complex devices quickly, and to accurately diagnose faults to enhance productivity and quality.