ATE systems

The 4200 series is the flagship of the Aeroflex range of automatic test equipment. Designed to be the fastest manufacturing test system on the market, it is ideally suited to high volume manufacturing operations where throughput is of paramount importance. With an established customer base, the system tests a wide variety of printed circuit boards covering applications such as telecoms, automotive and consumer electronics, amongst others.

By achieving the highest level of fault coverage, and testing product in the shortest possible time, the 4200 series reduces capital investment by providing a single test station within the beat rate of the production line. Quite simply, a single 4200 series tester can perform a task which would require several competitive systems.

– Maximum of 2048 pins
– Automatic program generation software
– Graphical program debug capability
– Autodebug facility
– Inductive and capacitive vectorless test
– Capacitor polarity
– ISP and FLASH programming

Architecture
The 4200 series is controlled by an industry standard PC running the Windows operating system. The graphical user interface has been designed to provide a familiar environment allowing new users to quickly progress along the learning curve.

Within the range, there are three systems, the 4215, 4220 and 4250.

The differences lay in the testpoint count and power supply capacity:
4215 – Maximum of 1152 universal testpoints & three user power supplies
4220 – Maximum of 2048 universal testpoints & up to six user power supplies
4250 – Small footprint and updated version of the 4220

All systems use a cardcage architecture and can be fitted with a range of cards selected from the following list to provide the most appropriate configuration:

• FA13 Analog In-Circuit card (44830/169)
• FA03 Universal In-Circuit card (44830/380)
• FA23 Non-Multiplexed Universal In-Circuit card (44830/166)
• FA18 General Purpose Input/Output card (44830/166)
• FA05 Instrument Access card (44828/875)
• FA08 Analog Functional Card (44830/164)

Already included cards:

• FA01 Master Test Controller Board (44829/871)
• FA02 Measurement & Interface Board (44829/872)
• FA06 Calibration Standards Board (44829-876)

The 5200 series is the fastest analog test system available, combining high speed and the ability to accurately test a wide range of component types, effectively blurring the line between MDA, or analog In-Circuit, and full digital In-Circuit. This capability minimizes the investment in test systems by reducing the number of platforms required to achieve throughput and providing the highest level of test coverage within a single manufacturing stage.

– Up to 1200 components/sec test speed
– Maximum of 2112 pins
– Power-up testing with programmable supply option
– Automatic program generation software
– Graphical program debug capability
– Autodebug facility
– Optional functional test capability
– Inductive and capacitive vectorless test
– 19 in rack mountable

The system is controlled by an industry standard PC, with a Windows 2000™ operating system. The 5200 series has a small footprint allowing simple integration into automated in-line manufacturing facilities.
Within the range, there are two systems, the 5210 with fixed unit under test (UUT) power supplies and the 5220 offering programmable versions.

Architecture
The testframe of the 5200 series is 19 in rack mountable containing eleven slots for testpoint cards, and a further three to take a range of functional resources. Each testpoint card offers 192 pins, interfaced to the test fixture through interconnection cabling. This approach provides the user with the ability to integrate the system into an inline handler or use a range of fixturing with a human operator.

Advanced Test Techniques
Test techniques such as analog In-Circuit, boundary scan and functional ensure the highest level of fault coverage. Although by definition, a Manufacturing Defects Analyzer does not provide digital device testing through testpoint memory, the 5200 series features a digital capability through the use of boundary scan and vectorless tools.

Vectorless Test Capability
Aeroflex Limited is unique in offering both inductive and capacitive vectorless techniques, ensuring wide test coverage across a range of components from complex ASICs to connectors. Inductive probing is performed using the Aeroflex patented Q-Test II technique, whilst capacitive tests use the industry standard HP TestJet™ probe. These two techniques contribute to the system’s ability to generate tests for complex devices quickly, and to accurately diagnose faults to enhance productivity and quality.

The multifunctional test system combines in-circuit testing with analogue and digital function testing. The user can also add PXI instruments to the 5800 system and control them seamlessly with the AIDE test environment. The 5800 series is available in three housing variants, as a tabletop unit (5820), built-in version (5830) and as a compact stand-alone unit (5860) with several industry standard interfaces.